About
Wafer Inspection and Measurement Systems
Orbot Instruments produced systems for measuring and inspecting patterned silicon wafers during the semiconductor manufacturing process, as well as systems for inspecting masks used during the patterning process. The technology was designed to increase yield and efficiency.
Identity
| Name | Orbot Instruments |
|---|---|
| Slug | orbot-instruments |
| Type / kind | startup |
| Source _id | agxzfmlsbGlzdHNpdGVyGAsSC05ld19Db21wYW55GICAgLPJl5cJDA |
Status
| Status | inactive |
|---|---|
| Status reason | Acquired (Inactive) by Applied Materials on Nov 1996 - closed due to acquisition |
| Last update | 2026-05-17 |
Location
| HQ country code | IL |
|---|---|
| HQ address | Israel |
Classifications
Primary sector Industrial Technologies
Sub-sectors
Industrial TechnologiesMicroelectronics & Photonics Solutions
Business models
B2B
Tags
printed-circuit-boardssemiconductorsinspection-and-testing
Funding
| Total raised | — |
|---|---|
| Current stage | Acquired |
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